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Improve test coverage in DcaeEvent 25/87525/3
authorm.kowalski3 <m.kowalski3@partner.samsung.com>
Mon, 13 May 2019 07:07:41 +0000 (09:07 +0200)
committerm.kowalski3 <m.kowalski3@partner.samsung.com>
Wed, 5 Jun 2019 06:58:48 +0000 (08:58 +0200)
commit25398f36c6b36b85ce521a42f6754c78a38fe552
tree53f00f898d8da06029c3fac4097f0df1b5bac8d9tree | snapshot
parent61ef2fb62f1818da16a48d75c7a3e0824e39e970commit | diff
Improve test coverage in DcaeEvent

Change-Id: Iead99d97d7ad2a803ef67cdf8a7eebaca76c60bd
Issue-ID: CLAMP-355
Signed-off-by: Marcin Kowalski <m.kowalski3@partner.samsung.com>
src/test/java/org/onap/clamp/clds/model/DcaeEventTest.java [new file with mode: 0644] blob
src/test/java/org/onap/clamp/loop/CsarInstallerItCase.java diff | blob | history
CLAMP is a platform for designing and managing control loops. Archived.