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(parent: e44176d) | patch
Don't escape in component tests 10/74610/1
authorFilip Krzywka <filip.krzywka@nokia.com>
Thu, 13 Dec 2018 13:03:37 +0000 (14:03 +0100)
committerFilip Krzywka <filip.krzywka@nokia.com>
Thu, 13 Dec 2018 13:03:37 +0000 (14:03 +0100)
commit7fefb1c29aed914511b518ecec3799569338d61b
treeb51aa26db0e2938ffaadc617c1438af58964248ftree | snapshot
parente44176d17c406b34f6ededb272acfcf3ba234c60commit | diff
Don't escape in component tests

We want our test output to be readable, so we should not escape
\n or \t in console output.

Change-Id: I4c673760ea0cd55007b47b7490036c0693887eda
Issue-ID: DCAEGEN2-1026
Signed-off-by: Filip Krzywka <filip.krzywka@nokia.com>
sources/hv-collector-core/src/test/resources/logback-test.xml diff | blob | history
sources/hv-collector-ct/src/test/resources/logback-test.xml diff | blob | history
High Volume VES Collector