Code Review / sdc.git / commit
? search:
summary | shortlog | log | commit | commitdiff | review | tree
(parent: 8d52607) | patch
Added unit tests for Audit 87/88887/3
authorPiotr Borelowski <p.borelowski@partner.samsung.com>
Thu, 30 May 2019 13:10:36 +0000 (15:10 +0200)
committerOren Kleks <orenkle@amdocs.com>
Tue, 4 Jun 2019 06:48:47 +0000 (06:48 +0000)
commit68e0d8cb6ac0c000c403abb9b0aa18d04e9105c4
tree78d1db6ad1023463a39321747f0283ccfeaae1eatree | snapshot
parent8d52607c8fa8fd4dde5f9c3fec0a8c6ee7a4960dcommit | diff
Added unit tests for Audit

Improve unit test coverage in sdc/catalog-fe

Issue-ID: SDC-2327
Signed-off-by: Piotr Borelowski <p.borelowski@partner.samsung.com>
Change-Id: Id6aaf7afded77ccedbaecbc1775c6dde1c1f1773
Signed-off-by: Piotr Borelowski <p.borelowski@partner.samsung.com>
catalog-fe/src/test/java/org/openecomp/sdc/fe/impl/AuditTest.java [new file with mode: 0644] blob
SDC Parent Project Catalog FE and BE