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(parent: a8e3bf2) | patch
Some unit tests for catalog-be 35/84435/3
authorTomasz Golabek <tomasz.golabek@nokia.com>
Sun, 7 Apr 2019 13:05:51 +0000 (15:05 +0200)
committerOfir Sonsino <ofir.sonsino@intl.att.com>
Mon, 8 Apr 2019 08:41:17 +0000 (08:41 +0000)
commit67437109d8df88ff494f8bd14faef44b7f5a2dee
tree9836911166cff8df40b4c278d9dfd9d13206e8e4tree | snapshot
parenta8e3bf27eec7832a89522b776f08dda8dc0985d2commit | diff
Some unit tests for catalog-be

Code coverage for some classes from catalog-be increased.
Some refactor made if needed.

Change-Id: I33114eed03d4e176896fd803b54fb77787c34283
Issue-ID: SDC-2220
Signed-off-by: Tomasz Golabek <tomasz.golabek@nokia.com>
catalog-be/src/main/java/org/openecomp/sdc/be/info/ArtifactAccessList.java diff | blob | history
catalog-be/src/main/java/org/openecomp/sdc/be/info/ArtifactDefinitionInfo.java diff | blob | history
catalog-be/src/test/java/org/openecomp/sdc/be/info/ArtifactAccessListTest.java diff | blob | history
catalog-be/src/test/java/org/openecomp/sdc/be/info/ArtifactDefinitionInfoTest.java diff | blob | history
catalog-be/src/test/java/org/openecomp/sdc/be/info/ArtifactTemplateInfoTest.java diff | blob | history
catalog-be/src/test/java/org/openecomp/sdc/be/info/ArtifactTypesInfoTest.java diff | blob | history
SDC Parent Project Catalog FE and BE