Catalog alignment
[sdc.git] / catalog-be / src / test / java / org / openecomp / sdc / be / components / distribution / engine / ArtifactInfoImplTest.java
index 409cdb6..0b9542c 100644 (file)
@@ -29,7 +29,11 @@ import org.openecomp.sdc.be.model.ComponentInstance;
 import org.openecomp.sdc.be.model.Service;
 import org.openecomp.sdc.common.api.ArtifactTypeEnum;
 
-import java.util.*;
+import java.util.Collection;
+import java.util.HashMap;
+import java.util.LinkedList;
+import java.util.List;
+import java.util.Map;
 
 public class ArtifactInfoImplTest extends BeConfDependentTest {
 
@@ -315,12 +319,4 @@ public class ArtifactInfoImplTest extends BeConfDependentTest {
                testSubject.setGeneratedFromUUID(generatedFromUUID);
        }
 
-       @Test
-       public void testUpdateArtifactTimeout() throws Exception {
-               ArtifactInfoImpl testSubject;
-
-               // default test
-               testSubject = createTestSubject();
-               testSubject.updateArtifactTimeout();
-       }
 }